RTL-based functional test generation for high defects coverage in digital SOCs - researchr publication authors

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Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. RTL-based functional test generation for high defects coverage in digital SOCs. In 5th European Test Workshop, ETW 2000, Cascais, Portugal, May 23-26, 2000. pages 99-104, IEEE Computer Society, 2000. [doi]

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