RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems

Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electronic Testing, 17(3-4):311-319, 2001. [doi]

Authors

Marcelino B. Santos

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Fernando M. Gonçalves

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Isabel C. Teixeira

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João Paulo Teixeira

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