The following publications are possibly variants of this publication:
- RTL Design Validation, DFT and Test Pattern Generation for High Defects CoverageMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. et, 18(2):179-187, 2002. [doi]
- RTL-based functional test generation for high defects coverage in digital SOCsMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. ets 2000: 99-104 [doi]
- Test preparation for high coverage of physical defects in CMOS digital ICsMarcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira. vts 1995: 330-337 [doi]