Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira. Test preparation for high coverage of physical defects in CMOS digital ICs. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 330-337, IEEE Computer Society, 1995. [doi]
Abstract is missing.