The following publications are possibly variants of this publication:
- Test preparation methodology for high coverage of physical defects in CMOS digital ICsMarcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira. date 1995: 604 [doi]
- RTL-Based Functional Test Generation for High Defects Coverage in Digital SystemsMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. et, 17(3-4):311-319, 2001. [doi]
- RTL Design Validation, DFT and Test Pattern Generation for High Defects CoverageMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira. et, 18(2):179-187, 2002. [doi]