Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira. Test preparation for high coverage of physical defects in CMOS digital ICs. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 330-337, IEEE Computer Society, 1995. [doi]
@inproceedings{SantosSTT95,
title = {Test preparation for high coverage of physical defects in CMOS digital ICs},
author = {Marcelino B. Santos and M. Simões and Isabel C. Teixeira and João Paulo Teixeira},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000330abs.htm},
tags = {test coverage, testing, C++, coverage},
researchr = {https://researchr.org/publication/SantosSTT95},
cites = {0},
citedby = {0},
pages = {330-337},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}