Characterization of a RISC-V System-on-Chip under Neutron Radiation

Douglas A. dos Santos, Lucas M. Luza, Maria Kastriotou, Carlo Cazzaniga, Cesar A. Zeferino, Douglas R. Melo, Luigi Dilillo. Characterization of a RISC-V System-on-Chip under Neutron Radiation. In 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, DTIS 2021, Montpellier, France, June 28-30, 2021. pages 1-6, IEEE, 2021. [doi]

Abstract

Abstract is missing.