Douglas A. dos Santos, André Martins Pio de Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo. Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip. In Luca Cassano, Sreejit Chakravarty, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{SantosMLCKMD22,
title = {Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip},
author = {Douglas A. dos Santos and André Martins Pio de Mattos and Lucas M. Luza and Carlo Cazzaniga and Maria Kastriotou and Douglas R. Melo and Luigi Dilillo},
year = {2022},
doi = {10.1109/DFT56152.2022.9962335},
url = {https://doi.org/10.1109/DFT56152.2022.9962335},
researchr = {https://researchr.org/publication/SantosMLCKMD22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022},
editor = {Luca Cassano and Sreejit Chakravarty and Alberto Bosio},
publisher = {IEEE},
isbn = {978-1-6654-5938-9},
}