Douglas A. dos Santos, André Martins Pio de Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo. Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip. In Luca Cassano, Sreejit Chakravarty, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022, Austin, TX, USA, October 19-21, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.