Douglas A. dos Santos, André Martins Pio de Mattos, Douglas R. Melo, Luigi Dilillo. Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments. In Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio, editors, IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, October 3-5, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.