Sayandeep Sanyal, Mayukh Bhattacharya, Pallab Dasgupta, Amit Patra. Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection. In 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems, VLSID 2023, Hyderabad, India, January 8-12, 2023. pages 325-330, IEEE, 2023. [doi]
@inproceedings{SanyalBDP23,
title = {Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection},
author = {Sayandeep Sanyal and Mayukh Bhattacharya and Pallab Dasgupta and Amit Patra},
year = {2023},
doi = {10.1109/VLSID57277.2023.00072},
url = {https://doi.org/10.1109/VLSID57277.2023.00072},
researchr = {https://researchr.org/publication/SanyalBDP23},
cites = {0},
citedby = {0},
pages = {325-330},
booktitle = {36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems, VLSID 2023, Hyderabad, India, January 8-12, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4678-7},
}