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Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection

Sayandeep Sanyal, Mayukh Bhattacharya, Pallab Dasgupta, Amit Patra. Accelerating Defect Simulation in Analog and Mixed-Signal Circuits by Parallel Defect Injection. In 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems, VLSID 2023, Hyderabad, India, January 8-12, 2023. pages 325-330, IEEE, 2023. [doi]

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