Sayandeep Sanyal, Aritra Hazra, Pallab Dasgupta, Scott Morrison, Sudhakar Surendran, Lakshmanan Balasubramanian, Mohammad Moshiur Rahman. Analog Coverage-driven Selection of Simulation Corners for AMS Integrated Circuits. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2023, Antwerp, Belgium, April 17-19, 2023. pages 1-6, IEEE, 2023. [doi]
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