Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL

Fareena Saqib, Dylan Ismari, Charles Lamech, Jim Plusquellic. Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. IEEE Trans. VLSI Syst., 23(4):776-780, 2015. [doi]

Authors

Fareena Saqib

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Dylan Ismari

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Charles Lamech

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Jim Plusquellic

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