Fareena Saqib, Dylan Ismari, Charles Lamech, Jim Plusquellic. Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL. IEEE Trans. VLSI Syst., 23(4):776-780, 2015. [doi]
@article{SaqibILP15,
title = {Within-Die Delay Variation Measurement and Power Transient Analysis Using REBEL},
author = {Fareena Saqib and Dylan Ismari and Charles Lamech and Jim Plusquellic},
year = {2015},
doi = {10.1109/TVLSI.2014.2318307},
url = {http://dx.doi.org/10.1109/TVLSI.2014.2318307},
researchr = {https://researchr.org/publication/SaqibILP15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {23},
number = {4},
pages = {776-780},
}