P. Saraza-Canflanca, Javier Diaz-Fortuny, A. Toro-Frias, R. Castro-López, Elisenda Roca, Javier Martín-Martínez, R. Rodrigucz, Montserrat Nafría, Francisco V. Fernández. Automated Massive RTN Characterization Using a Transistor Array Chip. In 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018. pages 29-32, IEEE, 2018. [doi]
@inproceedings{Saraza-Canflanca18,
title = {Automated Massive RTN Characterization Using a Transistor Array Chip},
author = {P. Saraza-Canflanca and Javier Diaz-Fortuny and A. Toro-Frias and R. Castro-López and Elisenda Roca and Javier Martín-Martínez and R. Rodrigucz and Montserrat Nafría and Francisco V. Fernández},
year = {2018},
doi = {10.1109/SMACD.2018.8434914},
url = {https://doi.org/10.1109/SMACD.2018.8434914},
researchr = {https://researchr.org/publication/Saraza-Canflanca18},
cites = {0},
citedby = {0},
pages = {29-32},
booktitle = {15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2018, Prague, Czech Republic, July 2-5, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5153-7},
}