New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors - researchr publication authors

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P. Saraza-Canflanca, Javier Diaz-Fortuny, R. Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodriguez, Montserrat Nafria, Francisco V. Fernandez. New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 150-155, IEEE, 2019. [doi]

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