A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies

Pablo Saraza-Canflanca, H. Carrasco-Lopez, A. Santana-Andreo, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001. A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3-1, IEEE, 2022. [doi]

@inproceedings{Saraza-Canflanca22,
  title = {A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies},
  author = {Pablo Saraza-Canflanca and H. Carrasco-Lopez and A. Santana-Andreo and Javier Diaz-Fortuny and Rafael Castro-López and Elisenda Roca and Francisco V. Fernández 0001},
  year = {2022},
  doi = {10.1109/IRPS48227.2022.9764587},
  url = {https://doi.org/10.1109/IRPS48227.2022.9764587},
  researchr = {https://researchr.org/publication/Saraza-Canflanca22},
  cites = {0},
  citedby = {0},
  pages = {3},
  booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-7950-9},
}