A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies

Pablo Saraza-Canflanca, H. Carrasco-Lopez, A. Santana-Andreo, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández 0001. A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 3-1, IEEE, 2022. [doi]

Abstract

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