Standby leakage current estimation model for multi threshold CMOS inverter circuit in deep submicron technology - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Hari Sarkar, Sudakshina Kundu. Standby leakage current estimation model for multi threshold CMOS inverter circuit in deep submicron technology. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-6, IEEE, 2015. [doi]

This author has not been identified. Look up 'Hari Sarkar' in GoogleThis author has not been identified. Look up 'Sudakshina Kundu' in Google

runs on WebDSL