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Multi-bit fault tolerant design for resistive memories through dynamic partitioning

Sutapa Sarkar, Mousumi Saha, Biplab K. Sikdar. Multi-bit fault tolerant design for resistive memories through dynamic partitioning. In 2017 IEEE East-West Design & Test Symposium, EWDTS 2017, Novi Sad, Serbia, September 29 - October 2, 2017. pages 1-6, IEEE Computer Society, 2017. [doi]

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Sutapa Sarkar

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Mousumi Saha

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Biplab K. Sikdar

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