Jos van Sas, Geert van Wauwe, Erik Huyskens, Dirk Rabaey. BIST for Embedded Static RAMs with Coverage Calculation. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 339-348, IEEE Computer Society, 1993.
@inproceedings{SasWHR93,
title = {BIST for Embedded Static RAMs with Coverage Calculation},
author = {Jos van Sas and Geert van Wauwe and Erik Huyskens and Dirk Rabaey},
year = {1993},
tags = {coverage},
researchr = {https://researchr.org/publication/SasWHR93},
cites = {0},
citedby = {0},
pages = {339-348},
booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
isbn = {0-7803-1430-1},
}