Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes. Distributed Probabilistic Diagnosis of MCMs on Large Area. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 208-216, IEEE Computer Society, 1995.
Abstract is missing.