Guido T. Sasse, Vignesh Subramanian, Ljubo Radic. Aging models for n- and p-type LDMOS covering low, medium and high VGS operation. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{SasseSR21, title = {Aging models for n- and p-type LDMOS covering low, medium and high VGS operation}, author = {Guido T. Sasse and Vignesh Subramanian and Ljubo Radic}, year = {2021}, doi = {10.1109/IRPS46558.2021.9405135}, url = {https://doi.org/10.1109/IRPS46558.2021.9405135}, researchr = {https://researchr.org/publication/SasseSR21}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021}, publisher = {IEEE}, isbn = {978-1-7281-6893-7}, }