Guido T. Sasse, Vignesh Subramanian, Ljubo Radic. Aging models for n- and p-type LDMOS covering low, medium and high VGS operation. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-6, IEEE, 2021. [doi]
Abstract is missing.