Takashi Sato, Toshiki Kanamoto, Saiko Kobayashi, Nobuhiko Goto, Takao Sato, Hitoshi Sugihara, Hiroo Masuda. A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance. IEICE Transactions, 93-A(9):1605-1611, 2010. [doi]
@article{SatoKKGSSM10,
title = {A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance},
author = {Takashi Sato and Toshiki Kanamoto and Saiko Kobayashi and Nobuhiko Goto and Takao Sato and Hitoshi Sugihara and Hiroo Masuda},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-a_9_1605},
tags = {modeling, macros},
researchr = {https://researchr.org/publication/SatoKKGSSM10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-A},
number = {9},
pages = {1605-1611},
}