Takashi Sato, Toshiki Kanamoto, Saiko Kobayashi, Nobuhiko Goto, Takao Sato, Hitoshi Sugihara, Hiroo Masuda. A New LDMOS Transistor Macro-Modeling for Accurately Predicting Bias Dependence of Gate-Overlap Capacitance. IEICE Transactions, 93-A(9):1605-1611, 2010. [doi]
Abstract is missing.