An efficient method of applying hot-carrier reliability simulation to logic design - researchr publication authors

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Hisuko Sato, Mariko Ohtsuka, Kazumasa Yanagisawa, Peter M. Lee. An efficient method of applying hot-carrier reliability simulation to logic design. In Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, CICC 2001, San Diego, CA, USA, May 6-9, 2001. pages 267-270, IEEE, 2001. [doi]

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