Hisuko Sato, Mariko Ohtsuka, Kazumasa Yanagisawa, Peter M. Lee. An efficient method of applying hot-carrier reliability simulation to logic design. In Proceedings of the IEEE 2001 Custom Integrated Circuits Conference, CICC 2001, San Diego, CA, USA, May 6-9, 2001. pages 267-270, IEEE, 2001. [doi]
Abstract is missing.