Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM

H. Sato, H. M. Shin, H. Jung, S. W. Lee, H. Bae, H. Kwon, K. H. Ryu, W. C. Lim, Y. S. Han, J.-H. Jeong, J. M. Lee, D. S. Kim, K. Lee, J. H. Lee, J. H. Park, Y. J. Song, Y. Ji, B. I. Seo, J. W. Kim, H. H. Kim. Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-5, IEEE, 2023. [doi]

Authors

H. Sato

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H. M. Shin

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H. Jung

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S. W. Lee

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H. Bae

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H. Kwon

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K. H. Ryu

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W. C. Lim

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Y. S. Han

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J.-H. Jeong

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J. M. Lee

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D. S. Kim

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K. Lee

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J. H. Lee

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J. H. Park

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Y. J. Song

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Y. Ji

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B. I. Seo

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J. W. Kim

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H. H. Kim

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