Yasuo Sato, Kazushi Sugiura, Reisuke Shimoda, Yutaka Yoshizawa, Kenji Norimatsu, Masaru Sanada. Defect Diagnosis - Reasoning Methodology. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 209-214, IEEE, 2006. [doi]
Abstract is missing.