Low Power BIST for Scan-Shift and Capture Power - researchr publication

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Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara. Low Power BIST for Scan-Shift and Capture Power. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 173-178, IEEE Computer Society, 2012. [doi]

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