Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura. A Persistent Diagnostic Technique for Unstable Defects. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 242-249, IEEE Computer Society, 2002. [doi]
@inproceedings{SatoYYIT02,
title = {A Persistent Diagnostic Technique for Unstable Defects},
author = {Yasuo Sato and Iwao Yamazaki and Hiroki Yamanaka and Toshio Ikeda and Masahiro Takakura},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430242abs.htm},
tags = {persistent, diagnostics},
researchr = {https://researchr.org/publication/SatoYYIT02},
cites = {0},
citedby = {0},
pages = {242-249},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}