Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura. A Persistent Diagnostic Technique for Unstable Defects. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 242-249, IEEE Computer Society, 2002. [doi]
Abstract is missing.