On Delay Elements in Boundary Scan Cells for Delay Testing of 3D IC Interconnection - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Toshiaki Satoh, Hiroyuki Yotsuyanagi, Masaki Hashizume. On Delay Elements in Boundary Scan Cells for Delay Testing of 3D IC Interconnection. In 2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019. pages 1-4, IEEE, 2019. [doi]

This author has not been identified. Look up 'Toshiaki Satoh' in GoogleThis author has not been identified. Look up 'Hiroyuki Yotsuyanagi' in GoogleThis author has not been identified. Look up 'Masaki Hashizume' in Google

runs on WebDSL