On Delay Elements in Boundary Scan Cells for Delay Testing of 3D IC Interconnection

Toshiaki Satoh, Hiroyuki Yotsuyanagi, Masaki Hashizume. On Delay Elements in Boundary Scan Cells for Delay Testing of 3D IC Interconnection. In 2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019. pages 1-4, IEEE, 2019. [doi]

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