Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian. On the quality of test vectors for post-silicon characterization. In 17th IEEE European Test Symposium, ETS 2012, May 28th - June 1st 2012, Annecy, France. pages 1-6, IEEE Computer Society, 2012. [doi]
Abstract is missing.