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On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP)

Martin Sauter, Werner Simbürger, David Johnsson, Matthias Stecher. On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP). Microelectronics Reliability, 51(8):1309-1314, 2011. [doi]

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