A Theory for the Design of Soft-Error-Tolerant VLSI Circuits

Yvon Savaria, Jeremiah F. Hayes, Nicholas C. Rumin, Vinod K. Agarwal. A Theory for the Design of Soft-Error-Tolerant VLSI Circuits. IEEE Journal on Selected Areas in Communications, 4(1):15-23, 1986. [doi]

Abstract

Abstract is missing.