Design for concurrent error detection and testability in storage/logic arrays

Howard V. Savin, Mary S. Bucknell, Marc D. Spaulding, Thomas B. Maciukenas, W. Kent Fuchs. Design for concurrent error detection and testability in storage/logic arrays. J. Solid-State Circuits, 29(7):770-779, July 1994. [doi]

Abstract

Abstract is missing.