Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory - researchr publication authors

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Jacob Savir, William H. McAnney, Salvatore R. Vecchio. Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 106-114, IEEE Computer Society, 1985.

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