William H. McAnney - researchr alias

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Viewing Publication 1 - 18 from 18

1992

A Multiple Seed Linear Feedback Shift RegisterJacob Savir, William H. McAnney. TC, 41(2):250-252, 1992.

1991

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. TC, 40(10):1177-1180, 1991.

1990

A multiple seed linear feedback shift registerJacob Savir, William H. McAnney. itc 1990: 657-659 [doi]

1989

Testing for Coupled Cells in Random-Access MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1989: 439-451

1988

Built-in test for RAMsPaul H. Bardell, William H. McAnney. dt, 5(4):29-36, 1988. [doi]

Built-In Checking of the Correct Self-Test SignatureWilliam H. McAnney, Jacob Savir. TC, 37(9):1142-1145, 1988.

Identification of Failing Tests with Cycling RegistersJacob Savir, William H. McAnney. itc 1988: 322-328

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. TC, 37(3):291-300, 1988.

1987

Fault Propagation Through Embedded Multiport MemoriesJacob Savir, William H. McAnney, Salvatore R. Vecchio. TC, 36(5):592-602, 1987.

1986

Pseudorandom Arrays for Built-In TestsPaul H. Bardell, William H. McAnney. TC, 35(7):653-658, 1986.

Built-In Checking of the Correct Self-Test SignatureWilliam H. McAnney, Jacob Savir. itc 1986: 54-59

Random Pattern Testability of Delay FaultsJacob Savir, William H. McAnney. itc 1986: 263-273

1985

Self-Test of Random Access MemoriesPaul H. Bardell, William H. McAnney. itc 1985: 352-355

Random Pattern Testing for Address-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 106-114

Random Pattern Testing for Data-Line Faults in an Embedded Multiport MemoryJacob Savir, William H. McAnney, Salvatore R. Vecchio. itc 1985: 100-105

1984

Parallel Pseudorandom Sequences for Built-In TestPaul H. Bardell, William H. McAnney. itc 1984: 302-308

Random Testing for Stuck-At Storage Cells in an Embedded MemoryWilliam H. McAnney, Paul H. Bardell, V. P. Gupta. itc 1984: 157-166

1982

Self-Testing of Multichip Logic ModulesPaul H. Bardell, William H. McAnney. itc 1982: 200-204

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