Paul H. Bardell - researchr alias

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Viewing Publication 1 - 19 from 19

1993

Built-In Self-Test: Milestones and ChallengesJacob Savir, Paul H. Bardell. vlsi, 1(1):23-44, 1993. [doi]

1992

Calculating the effects of linear dependencies in m-sequences used as test stimuliPaul H. Bardell. tcad, 11(1):83-86, 1992. [doi]

Discrete logarithms a parallel pseudorandom pattern generator analysis methodPaul H. Bardell. et, 3(1):17-31, 1992. [doi]

Primitive polynomials of degree 301 through 500Paul H. Bardell. et, 3(2):175-176, 1992. [doi]

1991

Production Experience with Built-In Self-Test in the IBM ES/9000 SystemPaul H. Bardell, Michael J. Lapointe. itc 1991: 28-36

Partitioning of polynomial tasks: test generation, an exampleJacob Savir, Paul H. Bardell. tcad, 10(11):1465-1468, 1991. [doi]

1990

Design considerations for Parallel pseudoRandom Pattern GeneratorsPaul H. Bardell. et, 1(1):73-87, 1990. [doi]

Analysis of cellular automata used as pseudorandom pattern generatorsPaul H. Bardell. itc 1990: 762-768 [doi]

1989

Calculating the Effects of Linear Dependencies in m-Sequences Used as Test StimuliPaul H. Bardell. itc 1989: 252-256

1988

Built-in test for RAMsPaul H. Bardell, William H. McAnney. dt, 5(4):29-36, 1988. [doi]

1987

TTTC 10th AnniversaryPaul H. Bardell. dt, 4(4):50-54, 1987. [doi]

1986

Pseudorandom Arrays for Built-In TestsPaul H. Bardell, William H. McAnney. TC, 35(7):653-658, 1986.

1985

Self-Test of Random Access MemoriesPaul H. Bardell, William H. McAnney. itc 1985: 352-355

1984

Parallel Pseudorandom Sequences for Built-In TestPaul H. Bardell, William H. McAnney. itc 1984: 302-308

Random Testing for Stuck-At Storage Cells in an Embedded MemoryWilliam H. McAnney, Paul H. Bardell, V. P. Gupta. itc 1984: 157-166

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. TC, 33(6):467-474, 1984.

Random Pattern TestabilityJacob Savir, Gary S. Ditlow, Paul H. Bardell. TC, 33(1):79-90, 1984.

1983

On Random Pattern Test LengthJacob Savir, Paul H. Bardell. itc 1983: 95-107

1982

Self-Testing of Multichip Logic ModulesPaul H. Bardell, William H. McAnney. itc 1982: 200-204

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