Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array - researchr publication authors

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Puneet Sawhney, Haroon Rasheed. Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array. In 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India. pages 191, IEEE Computer Society, 1995. [doi]

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