Puneet Sawhney, Haroon Rasheed. Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array. In 8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India. pages 191, IEEE Computer Society, 1995. [doi]
@inproceedings{SawhneyR95,
title = {Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array},
author = {Puneet Sawhney and Haroon Rasheed},
year = {1995},
doi = {10.1109/ICVD.1995.512104},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1995.512104},
researchr = {https://researchr.org/publication/SawhneyR95},
cites = {0},
citedby = {0},
pages = {191},
booktitle = {8th International Conference on VLSI Design (VLSI Design 1995), 4-7 January 1995, New Delhi, India},
publisher = {IEEE Computer Society},
}