Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess. On applying non-classical defect models to automated diagnosis. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 748-757, IEEE Computer Society, 1998. [doi]
Abstract is missing.