Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech. Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1120-1129, IEEE Computer Society, 2002. [doi]
Abstract is missing.