Refined Bounds on Signature Analysis Aliasing for Random Testing

Nirmal R. Saxena, Piero Franco, Edward J. McCluskey. Refined Bounds on Signature Analysis Aliasing for Random Testing. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 818-827, IEEE Computer Society, 1991.

Authors

Nirmal R. Saxena

This author has not been identified. Look up 'Nirmal R. Saxena' in Google

Piero Franco

This author has not been identified. Look up 'Piero Franco' in Google

Edward J. McCluskey

This author has not been identified. Look up 'Edward J. McCluskey' in Google