Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter

Nitin Saxena, C. Seshadhri. Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter. SIAM Journal on Computing, 41(5):1285-1298, 2012. [doi]

Authors

Nitin Saxena

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C. Seshadhri

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