Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter

Nitin Saxena, C. Seshadhri. Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter. SIAM Journal on Computing, 41(5):1285-1298, 2012. [doi]

Abstract

Abstract is missing.